LS225+N2000 Coating thickness Tester
LS225+N2000 Coating thickness Tester
Professional for measuring coating thickness with large flat area
Suitable for PCB board paint thickness measurement
Use its own weight to trigger measurement, consistent pressure, stable value
Ocerview
LS225 coating thickness meter with N2000 probe, professional for measuring the coating thickness with large flat area. The instrument uses the eddy current induction principle, the probe uses its own weight to ensure that the same force is used to press the probe during each measurement, and the value is stable. It is especially suitable for measuring the thickness of paint on PCB boards, and can also be used for measuring non-conductive coatings such as paint, anodic oxide layer, ceramics, etc. on non-magnetic metal substrates such as copper, aluminum, die-cast zinc, brass, etc.
Application
LS225+N2000 coating thickness gauge can be non-destructive measurement of non-conductive coating thickness on non-magnetic metal substrates, such as anodic oxide layer on the surface of various aluminum workpieces, three-proof paint on the surface of PCB boards, etc.. It can be used for production inspection, construction acceptance and sales exhibition site, and the application areas involve aviation industry, building materials, machinery, chemical industry, light industry and instrumentation and many other industries.
Parameter
LS225 Plating thickness tester host parameters
|
Parameter |
Value |
|
Display |
240×160 dot matrix LCD |
|
Power supply |
4pcs of 1.5V AAA alkaline battery |
|
Operation temperaturerange |
0℃-50℃ |
|
Storage temperaturerange |
-20℃-60℃ |
|
Host size |
148*76*26 mm (L*W*H) |
|
Weight (include battery) |
194g |
N2000 probe parameters
|
Parameter |
Value |
|
Measuring principle |
Eddy current |
|
Substrate |
Non-ferromagnetic metal |
|
Measuring range |
0.0-2000μm |
|
Resolution |
0.1μm: 0μm - 99.9μm |
|
Repeatability |
≤±(1%H + 0.2μm), H is the standard value |
|
Accuracy |
≤±(2%H+0.3μm) after 5 points calibration, H is the standard value |
|
Unit |
μm / mil |
|
Measuring interval |
0.8s |
|
Minimum substrate thickness |
0.03mm |
|
Calibration |
Support zero reference adjustment and 1 to 5-points calibration |
|
Probe size |
95.5*30 mm (Without connecting cable) |
|
Probe weight |
304g |
Packing
|
No. |
Description |
Quantity |
Unit |
|
1 |
LS225+N2000 Plating thickness tester |
1 |
pcs |
|
2 |
N2000 probe |
1 |
pcs |
|
3 |
NFe zero-adjustment plate |
1 |
pcs |
|
4 |
Standard films |
7 |
pcs |
|
5 |
User manual |
1 |
pcs |
|
6 |
Certificate / Warranty card |
1 |
pcs |
|
7 |
Plastic engineering case |
1 |
pcs |